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Research to find cracks in aircraft composites

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The X-ray scanner to be used at Southampton
The X-ray scanner to be used at Southampton

Qinetiq, University of Southampton and Nikon partner on X-ray inspection device



Qinetiq and the University of Southampton are partnering to develop an X-ray inspection device to be used in the maintenance of composite aircraft.

The three year Projectcan research project, which also involves Nikon Metrology, aims to develop and test methods for scanning and visualising the insides of large, flat components using X-rays. It is hoped the technology will to be used in the design, manufacture and maintenance for current and future generations of carbon composite aircraft.

The partners will develop the system for acquiring scan data and the software to reconstruct it into a 3-D volume image, allowing manipulation and visualisation using standard software.

Dr Thomas Blumensath, of the University of Southampton, said: “Conventional computed tomography techniques are widely used but are not well suited to image extended flat objects. We will be developing an alternative technique, which applies computed laminography techniques, to overcome the limitations of conventional computed tomography for large, flat components. This will enhance our ability to find defects in large composite parts, such as those which are increasingly used in modern aircraft.

“This will ultimately help in the production and maintenance processes and will assist in the development of more environmentally-friendly aeroplanes, as well as enhanced overall aircraft safety.”

As part of the same project, engineers from consultancy Axi-Tek and University College London will develop a new backscatter x-ray inspection technique to non-destructively inspect large area composite structures such as wing sections, engine cowlings and fuselage components.

Also known as “one-sided” x-ray inspection, backscatter allows the X-ray investigation of the structural integrity of composite materials from a single side of the component. The X-rays do not have to pass through and out the other side of the component. To enhance this technique, the team also intend to combine the backscatter x-ray with more conventional optical surface inspection.

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